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  4. Decay mechanisms of excited electrons in quantum-well states of ultrathin Pb islands grown on Si(111): Scanning tunneling spectroscopy and theory
 
research article

Decay mechanisms of excited electrons in quantum-well states of ultrathin Pb islands grown on Si(111): Scanning tunneling spectroscopy and theory

Hong, I.-Po
•
Brun, Christophe
•
Patthey, Francois  
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2009
Physical Review B

Using low-temperature scanning tunneling spectroscopy at 5 and 50 K, we studied the linewidth of unoccupied quantum-well states in ultrathin Pb islands, grown on Si(111) on two different Pb/Si interfaces. A quantitative analysis of the differential conductance spectra allowed us to determine the electron-electron (e-e), electron-phonon (e-ph) and the interface and defect contributions to the lifetime. Layer-dependent ab initio calculations of the e-ph linewidth contribution are in excellent agreement with the data. Importantly, the sum of the calculated e-e and e-ph lifetime broadening follows the experimentally observed quadratic energy dependence.

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Type
research article
DOI
10.1103/PhysRevB.80.081409
Web of Science ID

WOS:000269639300029

Author(s)
Hong, I.-Po
Brun, Christophe
Patthey, Francois  
Sklyadneva, I. Yu.
Zubizarreta, X.
Heid, R.
Silkin, V. M.
Echenique, P. M.
Bohnen, K. P.
Chulkov, E. V.
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Date Issued

2009

Published in
Physical Review B
Volume

80

Article Number

081409(R)

Subjects

ab initio calculations

•

electron-phonon interactions

•

elemental semiconductors

•

lead

•

metallic thin films

•

quantum wells

•

scanning tunnelling spectroscopy

•

silicon

•

spectral line broadening

•

Surface

•

Films

•

Microscope

•

Lifetime

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPS  
Available on Infoscience
November 30, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/59893
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