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conference paper
On recent developments for high-speed atomic force microscopy
2005
2005 Ieee/Asme International Conference on Advanced Intelligent Mechatronics, Vols 1 and 2
The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.
Type
conference paper
Web of Science ID
WOS:000232003500045
Authors
Publication date
2005
Published in
2005 Ieee/Asme International Conference on Advanced Intelligent Mechatronics, Vols 1 and 2
Start page
261
End page
264
Note
IEEE/ASME International Conference on Advanced Intelligent Mechatronics
JUL 24-28, 2005
Monterey, CA
Peer reviewed
REVIEWED
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Available on Infoscience
November 5, 2010
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