Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Reports, Documentation, and Standards
  4. AFEX: An Automated Fault Explorer for Faster System Testing
 
report

AFEX: An Automated Fault Explorer for Faster System Testing

Keller, Lorenzo
•
Marinescu, Paul Dan
•
Candea, George  
2008

Fault injection is an often overlooked component of the software test cycle, yet it is critical for building robust systems. The main reasons for this neglect are ineffectual tools, an overwhelmingly large number of possible faults to inject, and extensive manual labor required to do such tests. We present AFEX, a system that automates fault injection for software systems, finds and ranks important faults faster and more accurately than random injection, and automatically characterizes the quality of the resulting fault sets. AFEX is parallelized, such that test time decreases linearly with the number of test nodes available. AFEX also includes four fault injectors that simulate faults in major layers in the system stack: hardware, network, libraries, and human operators. We show how AFEX uses metric-driven search algorithms to efficiently find top-ranked faults in real systems like MySQL cluster and rsync.

  • Details
  • Metrics
Type
report
Author(s)
Keller, Lorenzo
Marinescu, Paul Dan
Candea, George  
Date Issued

2008

Subjects

fault injection

•

automated testing

Written at

EPFL

EPFL units
DSLAB  
Available on Infoscience
September 14, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/53653
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés