Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics

We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 mu m wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 mu m away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined. (C) 2007 Optical Society of America.


Published in:
Optics Letters, 32, 2723-2725
Year:
2007
Publisher:
Optical Society of America
ISSN:
0146-9592
Keywords:
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