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conference paper
Non-Quasi-Static (NQS) Thermal Noise Modeling of the MOS Transistor
2003
Symposium on Fluctuations and Noise - Noise in Devices and Circuits
Type
conference paper
Authors
Publication date
2003
Publisher
Published in
Symposium on Fluctuations and Noise - Noise in Devices and Circuits
Series title/Series vol.
SPIE Proceedings; 5113
Start page
78
End page
92
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
June 24, 2010
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