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conference paper
An Efficient Parameter Extraction Methodology for the EKV MOST Model
1996
Proceedings of International Conference on Microelectronic Test Structures
Type
conference paper
Authors
Publication date
1996
Published in
Proceedings of International Conference on Microelectronic Test Structures
Start page
145
End page
150
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
June 24, 2010
Use this identifier to reference this record