Statistical modeling of inter-device correlations with BPV

The backward propagation of variance (BPV) technique for statistical modeling has proven to be efficient and effective in practice. In this paper we extend the BPV formalism to explicitly include modeling of the correlations between electrical performances. The new formulation is verified by applying it to two different MOSFET models and two different manufacturing technologies. (C) 2010 Elsevier Ltd. All rights reserved.


Published in:
Solid State Electronics, 54, 796-800
Year:
2010
Publisher:
Elsevier
ISSN:
0038-1101
Keywords:
Laboratories:


Note: The status of this file is: EPFL only


 Record created 2010-06-04, last modified 2018-03-17

n/a:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)