Statistical modeling of inter-device correlations with BPV
The backward propagation of variance (BPV) technique for statistical modeling has proven to be efficient and effective in practice. In this paper we extend the BPV formalism to explicitly include modeling of the correlations between electrical performances. The new formulation is verified by applying it to two different MOSFET models and two different manufacturing technologies. (C) 2010 Elsevier Ltd. All rights reserved.
Keywords: Backward propagation of variance ; Device correlation ; Semiconductor device modeling ; Statistical modeling ; Parametric Yield Estimation ; Vlsi Circuits ; Mosfet Model ; Simulation ; Fluctuations ; Psp ; Design
Record created on 2010-06-04, modified on 2016-08-08