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research article
Localized electronic excitations in NiO studied with resonant inelastic X-ray scattering at the Ni M threshold: Evidence of spin flip
We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M-2,M-3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to dd excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.
Type
research article
Web of Science ID
WOS:000233062900063
Authors
Ghiringhelli, G.
•
Dallera, C.
•
•
Amann, P.
•
•
Braicovich, L.
•
Patthey, L.
•
Chiuzbaian, S. G.
Publication date
2005
Publisher
Published in
Volume
95
Article Number
197402
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
April 7, 2010
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