Probability metrics to calibrate stochastic chemical kinetics, Proceedings of 2010 IEEE International Symposium on Circuits and Systems


Published in:
2010 IEEE International Symposium on Circuits and Systems Proceedings, 541-544
Presented at:
2010 IEEE International Symposium on Circuits and Systems, Paris, May 30 - June 2
Year:
2010
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 Record created 2010-02-13, last modified 2018-12-03

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