Topic Models for Scene Analysis and Abnormality Detection
2009
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Title
Topic Models for Scene Analysis and Abnormality Detection
Author(s)
Varadarajan, Jagannadan ; Odobez, Jean-Marc
Published in
2009 IEEE 12th International Conference on Computer Vision Workshops, ICCV Workshops
Pages
1338-1345
Conference
IEEE - 9th International Workshop in Visual Surveillance, Kyoto, Japan
Date
2009
Publisher
IEEE
Additional link
URL
Laboratories
LIDIAP
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LIDIAP - L'IDIAP Laboratory
Scientific production and competences > Euler Center for Signal Processing
Conference Papers
Work produced at EPFL
Published
Scientific production and competences > Euler Center for Signal Processing
Conference Papers
Work produced at EPFL
Published
Record creation date
2010-02-11