High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc
2009
Details
Title
High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc
Author(s)
Kim, M.-S. ; Scharf, T. ; Herzig, H. P.
Conference
International Symposium on Optical Memory, Nagasaki Japan, October 4-8 2009
Date
2009
Laboratories
OPT