High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc
Kim, M.-S.; Scharf, T.; Herzig, H. P.
2009

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Title High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc
Author(s) Kim, M.-S. ; Scharf, T. ; Herzig, H. P.
Conference International Symposium on Optical Memory, Nagasaki Japan, October 4-8 2009
Date 2009
Laboratories OPT
Record Appears in Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > OPT - Optics and Photonics Technology Laboratory
Presentations & Talks
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