Infoscience

Presentation / Talk

High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc

Kim, M.-S.; Scharf, T.; Herzig, H. P.
  • Presented at: International Symposium on Optical Memory, Nagasaki Japan, October 4-8 2009
  • Publication date: 2009

    Reference

    • OPT-PRESENTATION-2010-004

    Record created on 2010-01-22, modified on 2017-05-10

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