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High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc

Kim, M.-S. ; Scharf, T. ; Herzig, H. P.

Presented at:
International Symposium on Optical Memory, Nagasaki Japan, October 4-8 2009
Year:
2009
Laboratories:
OPT

Record appears in:
Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > OPT - Optics and Photonics Technology Laboratory
Presentations & Talks
Work produced at EPFL
Published



 Record created 2010-01-22, last modified 2018-03-17


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