Infoscience

Presentation / Talk

Characterization of small size microlenses by high resolution interference immersion microscopy

Scharf, Toralf; Kim, M.-S.; Herzig, Hans Peter
  • Presented at: 15th Microoptics Conference (MOC 09), Tokyo, October 25-28 2009
  • Publication date: 2009

    Reference

    • OPT-PRESENTATION-2010-002

    Record created on 2010-01-22, modified on 2017-05-10

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