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  4. Characterization of small size microlenses by high resolution interference immersion microscopy
 
conference presentation

Characterization of small size microlenses by high resolution interference immersion microscopy

Scharf, Toralf  
•
Kim, M.-S.  
•
Herzig, Hans Peter  
2009
15th Microoptics Conference (MOC 09)
  • Details
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Type
conference presentation
Author(s)
Scharf, Toralf  
Kim, M.-S.  
Herzig, Hans Peter  
Date Issued

2009

URL

Conference website

http://www.moc2009.com/conference.html
Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
15th Microoptics Conference (MOC 09)

Tokyo

October 25-28 2009

Available on Infoscience
January 22, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/45953
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