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research article

Finite element analysis and analytical simulations of Suspended Gate-FET for ultra-low power inverters

Tsamados, Dimitrios
•
Singh Chauhan, Yogesh  
•
Eggimann, Christoph
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2008
Solid-State Electronics

This paper proposes, the investigation of the Suspended Gate Field-Effect Transistor (SG-FET) small-slope switch based on a hybrid numerical simulation approach combining ANSYSTM Multiphysics and ISE-DESSISTM in a self-consistent system. The proposed numerical simulations uniquely enable the investigation of the behavior and the physics of complex micro-electro-mechanical/solid-state devices, such as the SG-FET. Abrupt switching as well as the effect of trapped charges in the gate dielectric are demonstrated. The numerical data serve to calibrate an analytical EKV-based SG-FET model, which is then used to design and originally simulate a sub-micron (90 nm) scaled SG-FET complementary inverter. It is shown that, due to abrupt switching in the subthreshold region and electro-mechanical hysteresis, the SG-FET inverter could deliver a significant power saving (1-2 decades reduction of inverter peak current and practically no leakage power) compared to traditional CMOS inverter.

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Type
research article
DOI
10.1016/j.sse.2008.04.013
Web of Science ID

WOS:000259688300018

Author(s)
Tsamados, Dimitrios
Singh Chauhan, Yogesh  
Eggimann, Christoph
Akarvardar, Kerem
Philip Wong, H. S.
Mihai Ionescu, Adrian  
Date Issued

2008

Published in
Solid-State Electronics
Volume

52

Issue

9

Start page

1374

End page

1381

Subjects

Suspended Gate-Field-Effect Transistor

•

MEMS/NEMS

•

Computational modeling and simulation

•

Low power

•

Micro-electro-mechanical switch

URL

URL

internal-pdf://Finite element analysis and analytical simulations of Suspend-2713056768/Finite element analysis and analytical simulations of Suspended Gate-FET for ultra-low power inverters.PDF
Editorial or Peer reviewed

REVIEWED

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Available on Infoscience
January 8, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/45164
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