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conference paper
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth
2009
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Type
conference paper
Authors
Publication date
2009
Published in
Proceedings of the 4th International Conference on Nano-Nets (Nano-Net)
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Lucerne, Switzerland | October 18-20, 2009 | |
Available on Infoscience
November 19, 2009
Use this identifier to reference this record