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conference paper
New evidence for reconstruction at the Si(100)-SiO2 interface from analysis of ion scattering
2003
proceedings of the 26th International Conference on the Physics of Semiconductors
Type
conference paper
Authors
Publication date
2003
Publisher
Published in
proceedings of the 26th International Conference on the Physics of Semiconductors
Issue
171
Start page
D6
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Edinburgh, UK | 29 July-2 August, 2002 | |
Available on Infoscience
October 14, 2009
Use this identifier to reference this record