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research article
Off-axis low coherence interferometry contouring
In this article we present a method to achieve tri-dimensional contouring of macroscopic objects. A modified reference wave speckle interferometer is used in conjunction with a source of reduced coherence. The depth signal is given by the envelope of the interference signal, directly determined by the coherence length of the source. Fringes are detected in the interferogram obtained by a single shot and are detected by means of adequate filtering. With the approach based on off-axis configuration, a contour line can be extracted from a single acquisition, thus allowing to use the system in harsh environment.
Type
research article
Web of Science ID
WOS:000271691300025
Authors
Publication date
2009
Published in
Volume
282
Issue
23
Start page
4595
End page
4601
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
August 21, 2009
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