Surface roughness parameters measurements by Digital Holographic Microscopy (DHM)
2006
Details
Title
Surface roughness parameters measurements by Digital Holographic Microscopy (DHM)
Author(s)
Montfort, Frédéric ; Emery, Yves ; Solanas, E. ; Cuche, Etienne ; Aspert, Nicolas ; Marquet, Pierre ; Joris, Claude ; Kühn, Jonas ; Depeursinge, Christian
Published in
Proceedings of the International Symposium on Precision Mechanical Measurements
Conference
International Symposium on Precision Mechanical Measurements, Urumqi, August 2-6, 2006
Date
2006
Keywords
Laboratories
LOA
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2009-08-03