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conference paper
Sub-Nanometer Resolution over Several Microns Range with Real-Time Dual- Wavelength Digital Holographic Microscopy
2008
Digital Holography and Three-Dimensional Imaging
Single-acquisition dual-wavelength digital holographic microscopy provides real-time phase measurement range over several microns. We demonstrate axial resolution enhancement down to sub-nanometer range thanks to the non- correlation between both available wavefronts.
Type
conference paper
Authors
Publication date
2008
Publisher
Published in
Digital Holography and Three-Dimensional Imaging
Start page
DTuC2
Peer reviewed
NON-REVIEWED
EPFL units
Event name | Event place | Event date |
St. Petersburg, Florida | March 16, 2009 | |
Available on Infoscience
July 20, 2009
Use this identifier to reference this record