Sub-Nanometer Resolution over Several Microns Range with Real-Time Dual- Wavelength Digital Holographic Microscopy

Single-acquisition dual-wavelength digital holographic microscopy provides real-time phase measurement range over several microns. We demonstrate axial resolution enhancement down to sub-nanometer range thanks to the non- correlation between both available wavefronts.


Published in:
DTuC2
Presented at:
Digital Holography and Three-Dimensional Imaging, St. Petersburg, Florida, March 16, 2009
Year:
2008
Publisher:
OSA
Keywords:
Laboratories:




 Record created 2009-07-20, last modified 2018-03-17

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