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  4. Real-time dual-wavelength digital holographic microscopy with a single hologram
 
conference paper

Real-time dual-wavelength digital holographic microscopy with a single hologram

Kühn, J.
•
Colomb, T.  
•
Montfort, F.  
Show more
2007
Optical Measurement Systems for Industrial Inspection V
Europe Optical Metrology

We report on a method to achieve real-time dual-wavelength digital holographic microscopy with a single hologram acquisition. By recording both interferograms from two laser sources at different wavelengths in only one spatially-multiplexed digital hologram, we are able to independently propagate and apply numerical corrections on both wavefronts in order to obtain a beat-wavelength phase map of the specimen. This beat-wavelength being up to 10-100 times larger than the original wavelengths, we are in a situation where the 2? phase ambiguity of conventional DHM is removed and the phase measurement range of the technique is extended up to several tens of microns in height. The unique capability to perform such an operation with a single acquisition unables real-time dual-wavelength DHM measurements. Results on a moving micro-mirror are presented in this paper. We think that such a real-time dual-wavelength method represents a strong improvement to the current DHM state-of-the-art, and that it opens a whole new field of applications for this technique.

  • Details
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Type
conference paper
DOI
10.1117/12.726083
Web of Science ID

WOS:000251243000036

Author(s)
Kühn, J.
Colomb, T.  
Montfort, F.  
Charrière, F.  
Depeursinge, C.  
Date Issued

2007

Publisher

SPIE

Published in
Optical Measurement Systems for Industrial Inspection V
ISBN of the book

9780819467584

978-0-8194-6758-4

Series title/Series vol.

SPIE Proceedings; 6616

Start page

61615

Subjects

[MVD]

•

Beat-wavelength

•

Digital holography

•

Dual-wavelength

•

Microscopy

•

Two-wavelengths

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Europe Optical Metrology

Munich

June 17-21, 2007

Available on Infoscience
July 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41639
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