Low voltage Ferroelectric FET with sub-100nm copolymer P(VDF-TrFE) gate dielectric for non-volatile 1T memory

• Published in: Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European, p. 162-165
• : , 2008

A polymer based Ferroelectric gate FET at 1T non-volatile memory on bulk silicon is demonstrated. Spin-coated 40 nm and 100 nm P(VDF-TrFE) (70%-30%) ultra-thin films have been integrated onto 10 nm SiO₂ layer as gate dielectric into a conventional silicon n-MOSFETs. A 1T non-volatile memory cell with an operating voltage as low as 6 V, for the thinnest (40 nm) gate ferroelectric copolymer dielectric, is demonstrated for the first time. The reported Fe-FET devices have Ion/Ioff ranging from $10^5$ to $10^6$ and retention time up to few days. Experiments show reliable memory operation up to $10^5$ cycles and programming time in the order of ms.

Keywords: MOSFET ; conducting polymers ; ferroelectric devices ; polymer blends ; polymer films ; semiconductor storage ; copolymer gate dielectric ; low voltage ferroelectric FET ; nonvolatile memory ; spin coating ; ultrathin films

Reference

• NANOLAB-CONF-2008-021
• doi:10.1109/ESSDERC.2008.4681724
• View record in Web of Science

Record created on 2009-07-15, modified on 2017-05-10