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conference paper
Investigation of Strain Profile Optimization in Gate-All-Around Suspended Silicon Nanowire FET
2008
The 38th European Solid-State Device Research Conference (IEEE ESSDERC 2008)
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Name
Najmzadeh-ESSDERC2008.pdf
Access type
openaccess
Size
989.12 KB
Format
Adobe PDF
Checksum (MD5)
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