Thick PZT sol-gel films for pMUT transducers performances improvement

Piezoelectric micromachined ultrasonic transducers comprising a 10 mu m thick Si device layer and a 14 pro thick piezoelectric PZT layer were investigated. The PZT films were deposited by a sol-gel technique. The transverse piezoelectric coefficient was measured as -14.9 C/m(2). The electromechanical coupling increased stronger as expected with PZT thickness. The influence of both the shape and area of the top electrode on the device performance has been investigated. The electromechanical coupling coefficient (k) and quality factor (Q) have been measured in air and were fitted to an equivalent circuit model. The maximal k(2) was obtained as 7.8%.


Published in:
Proceedings of IEEE Ultrasonics Symposium 2006, 1-5, 926-929
Presented at:
2006 IEEE ULTRASONICS SYMPOSIUM, Vancouver, Canada, Oct 03-06, 2006
Year:
2006
Publisher:
None, None
Keywords:
Laboratories:




 Record created 2009-06-25, last modified 2018-03-17


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