Influence of Positive Ions on the Current-Voltage Characteristics of MOS Structures

A new mathematical approach for the influence of mobile positive ions on the current-voltage characteristics of MOS structures is presented. This new method gives formulations which are more applicable than those described in the literature. Examples of the application of these formulations are presented.


Published in:
J. Appl. Phys., 49, 5, 2876-2879
Year:
1978
Note:
3
Laboratories:




 Record created 2009-05-12, last modified 2018-01-28


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