Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning eletrochemical microscopy
A new method for measuring local interfacial impedance properties with high lateral resolution was developed by combination of electrochemical impedance spectroscopy (EIS) with scanning electrochemical microscopy (SECM). Alternating current scanning electrochemical microscopy (AC-SECM) allowed to identify and visualise microscopic domains of different conductivity/electrochemical activities on solid/liquid interfaces immersed into an electrolyte. The performance of the method was illustrated by imaging an array of Pt-band microelectrodes in solutions of low conductivity in the absence of any redox mediator. © 2002 Elsevier Science B.V. All rights reserved.
Record created on 2009-05-12, modified on 2016-08-08