conference paper
Technological and Scientific challenges of Atomic Force Microscopy on Mars
2003
4th International Symposium on MEMS and Nanotechnology
Type
conference paper
Author(s)
Date Issued
2003
Published in
4th International Symposium on MEMS and Nanotechnology
Editorial or Peer reviewed
NON-REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
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