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conference paper
Technological and Scientific challenges of Atomic Force Microscopy on Mars
2003
4th International Symposium on MEMS and Nanotechnology
Type
conference paper
Authors
•
Staufer, U.
•
•
Hidber, H.-R.
•
Tonin, A.
•
Howald, L.
•
Müller, D.
•
Publication date
2003
Published in
4th International Symposium on MEMS and Nanotechnology
Peer reviewed
NON-REVIEWED
EPFL units
Available on Infoscience
May 12, 2009
Use this identifier to reference this record