Technological and Scientific challenges of Atomic Force Microscopy on Mars
2003
Details
Title
Technological and Scientific challenges of Atomic Force Microscopy on Mars
Author(s)
Gautsch, S. ; Staufer, U. ; Akiyama, T. ; Hidber, H.-R. ; Tonin, A. ; Howald, L. ; Müller, D. ; de Rooij, N. F.
Published in
4th International Symposium on MEMS and Nanotechnology
Date
2003
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12