Atomic force microscope for planetary applications
2000
Details
Title
Atomic force microscope for planetary applications
Author(s)
Gautsch, S. ; Akiyama, T. ; de Rooij, N. F. ; Staufer, U. ; Niedermann, P. ; Howald, L. ; Müller, D. ; Tonin, A. ; Hidber, H.-R. ; Pike, W. T. ; Hecht, M. H.
Published in
Solid-State Sensor and Actuator Workshop
Pages
267-270
Date
2000
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12