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  4. On the coupling and transmission of transverse and longitudinal fields into fully metal-coated optical nano-probes
 
conference paper

On the coupling and transmission of transverse and longitudinal fields into fully metal-coated optical nano-probes

Descrovi, E.
•
Vaccaro, L.
•
Aeschimann, L.
Show more
2005
Nanomanipulation with Light
Integrated Optoelectronic Devices 2005

Fully-metal-coated near-field optical probes, based on a cantilever design, have been studied theoretically and experimentally. Numerical simulations prove that these structures allow non-zero modal emission of the electromagnetic field trough a 60 nm thick metallic layer, that is opaque when deposited on flat substrates. The far-field intensity patterns recorded experimentally correspond to the ones calculated for the fundamental and first excited LP modes. Moreover, this study demonstrates that a high confinement of the electromagnetic energy can be reached in the near-field, when illuminated with radially polarized light. Finally, it was verified that the confinement of the field depends on the volume of the probe apex. The coupling and transmission of transverse and longitudinal fields into the probes has been also investigated. Two kinds of probes with different metal coating roughness are considered. Transverse and longitudinal field distributions are obtained by focusing azimuthally and radially polarized beams produced by means of a liquid crystal plate. The focal plane is scanned using microfabricated probes in a collection mode configuration. It is found that the roughness of the metal coating plays an important role in the coupling strength of transverse fields into the probes: the relative coupling efficiency for transverse fields diminishes with a rough metal coating, while that of longitudinal fields does not.

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Type
conference paper
DOI
10.1117/12.589778
Scopus ID

2-s2.0-21844472498

Author(s)
Descrovi, E.
Vaccaro, L.
Aeschimann, L.
Nakagawa, W.
Staufer, U.
Scharf, T.
Herzig, H. P.
Date Issued

2005

Published in
Nanomanipulation with Light
Series title/Series vol.

SPIE Proceedings; 5736

Start page

96

Note

393

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
OPT  
Event nameEvent placeEvent date
Integrated Optoelectronic Devices 2005

San Jose, California, United States

22-27 January 2005

Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39203
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