Loading...
conference paper
Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB
2006
16th International Microscopy Congress IMC16
Type
conference paper
Authors
Dadras, M.
•
Leboeuf, M.
•
Felberbaum, L.
•
Scherrer, D.
•
Laporte, V.
•
Vincent, E.
Publication date
2006
Published in
16th International Microscopy Congress IMC16
Start page
1114
Peer reviewed
NON-REVIEWED
EPFL units
Available on Infoscience
May 12, 2009
Use this identifier to reference this record