Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB
Dadras, M.; Leboeuf, M.; Felberbaum, L.; Scherrer, D.; Laporte, V.; Vincent, E.
2006

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Title Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB
Author(s) Dadras, M. ; Leboeuf, M. ; Felberbaum, L. ; Scherrer, D. ; Laporte, V. ; Vincent, E.
Published in 16th International Microscopy Congress IMC16
Pages 1114
Date 2006
Laboratories SAMLAB
Record Appears in Scientific production and competences > Archives > STI - School of Engineering > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
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