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Conference paper

Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB

Dadras, M.; Leboeuf, M.; Felberbaum, L.; Scherrer, D.; Laporte, V.; Vincent, E.
  • Published in: 16th International Microscopy Congress IMC16, p. 1114
  • Publication date: 2006

    Reference

    • SAMLAB-CONF-2006-013

    Record created on 2009-05-12, modified on 2016-08-08

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