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Dihedral Angle Measurement of Pb in Cu: Advantages of TEM Sample Preparation by FIB

Dadras, M. ; Leboeuf, M. ; Felberbaum, L. ; Scherrer, D.[...]

Published in:
16th International Microscopy Congress IMC16, 1114
Year:
2006
Laboratories:
SAMLAB

Record appears in:
Scientific production and competences > Archives > STI - School of Engineering > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published



 Record created 2009-05-12, last modified 2018-03-17


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