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Microfabricated Scanning Probe Systems for Micro- and Nanoscale Analysis and Structuring of Interfaces

Auger, V. ; Akiyama, T. ; de Rooij, N. F. ; Koudelka-Hep, M.[...]

Published in:
Twannberg Workshop on Nanoscience, 20
Year:
2002
Laboratories:
SAMLAB

Record appears in:
Scientific production and competences > Archives > STI - School of Engineering > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published



 Record created 2009-05-12, last modified 2018-03-17


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