Infoscience

Conference paper

Microfabricated Scanning Probe Systems for Micro- and Nanoscale Analysis and Structuring of Interfaces

Auger, V.; Akiyama, T.; de Rooij, N. F.; Koudelka-Hep, M.; Campana, F.; Eichenberger, N.; Siegenthaler, H.; Ballesteros Katemann, B.; Schuhmann, W.
  • Published in: Twannberg Workshop on Nanoscience, p. 20
  • Publication date: 2002

    Reference

    • SAMLAB-CONF-2002-005

    Record created on 2009-05-12, modified on 2016-08-08

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material

Contacts

EPFL authors