Infoscience

Conference paper

Fabrication and Testing of an Integrated Force Sensor Based on a MOS Transistor for Applications in Scanning Force Microscopy

    Reference

    • SAMLAB-CONF-1997-001

    Record created on 2009-05-12, modified on 2016-08-08

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material