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research article
Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics
A fully functional arrangement of a 2×1 array of active and self-detecting cantilevers, stress sensing metal-oxide-semiconductor transistors and thermal bimorph actuators was introduced. One of the two cantilevers was used as a reference while the other one was in AFM operation to compensate for the crosscoupling signal from the actuator to the sensor. This arrangement was not found applicable for many cantilevers in parallel.
Type
research article
Author(s)
•
Staufer, U.
•
•
Lange, D.
•
Hagleitner, C.
•
Brand, O.
•
Baltes, H.
•
Tonin, A.
•
Hidber, H.-R.
Date Issued
2000
Published in
Volume
B18
Start page
2669
End page
2675
Note
227
Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
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