conference paper
Characterization and fabrication of fully metal coated Scanning Near-Field Optical Microscopy SiO2 tips
2003
Journal of Microscopy
Cite this item
Aeschimann, L., Akiyama, T., Eckert, R., Heinzelmann, H., Staufer, U., & de Rooij, N. F. (2003). Characterization and fabrication of fully metal coated Scanning Near-Field Optical Microscopy SiO2 tips. Journal of Microscopy, 209(3), 182–187. https://doi.org/10.1046/j.1365-2818.2003.01107.x
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Type
conference paper
Author(s)
Date Issued
2003
Published in
Journal of Microscopy
Volume
209
Issue
3
Start page
182
End page
187
Editorial or Peer reviewed
NON-REVIEWED
Written at
OTHER
EPFL units
| Event name | Event place | Event date |
University of Rochester, U.S.A. | 11–15 August 2002 | |
Available on Infoscience
May 12, 2009
Use this identifier to reference this record