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conference paper
Characterization and fabrication of fully metal coated Scanning Near-Field Optical Microscopy SiO2 tips
2003
Journal of Microscopy
Type
conference paper
Authors
Publication date
2003
Published in
Journal of Microscopy
Volume
209
Issue
3
Start page
182
End page
187
Peer reviewed
NON-REVIEWED
EPFL units
Event name | Event place | Event date |
University of Rochester, U.S.A. | 11–15 August 2002 | |
Available on Infoscience
May 12, 2009
Use this identifier to reference this record