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  4. Metrology of refractive microlens arrays
 
conference paper

Metrology of refractive microlens arrays

Weible, K. J.
•
Völkel, R.
•
Eisner, M.
Show more
2004
Optical Micro- and Nanometrology in Manufacturing Tecnology
  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.545458
Author(s)
Weible, K. J.
Völkel, R.
Eisner, M.
Hoffmann, S.
Scharf, T.  
Herzig, H. P.  
Date Issued

2004

Publisher

SPIE-The International Society for Optical Engineering, Bellingham, USA

Published in
Optical Micro- and Nanometrology in Manufacturing Tecnology
Series title/Series vol.

Proc. SPIE; 5458

Start page

43

End page

51

Written at

OTHER

EPFL units
OPT  
Available on Infoscience
April 22, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/37929
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