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conference paper
Shape measurement by multiple-wavelength interferometry
1999
Optical Measurement Systems for Industrial Inspection
Type
conference paper
Authors
Publication date
1999
Published in
Optical Measurement Systems for Industrial Inspection
Series title/Series vol.
Proc. SPIE; 3824
Start page
72
End page
78
EPFL units
Available on Infoscience
April 22, 2009
Use this identifier to reference this record