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conference paper
KFM detection of quantified charges injected into a thin SiO2 layer containing Si nps embedded by ultra low energy ion implantation using stencil lithography
2008
Materials and emerging technologies for non-volatile-memory devices
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Name
Dumas 2008 EMRS.pdf
Access type
openaccess
Size
206.29 KB
Format
Adobe PDF
Checksum (MD5)
e8e14b27eb2627fbb426876ecbd8c460