KFM detection of quantified charges injected into a thin SiO2 layer containing Si nps embedded by ultra low energy ion implantation using stencil lithography


Published in:
Materials and emerging technologies for non-volatile-memory devices
Presented at:
European Materials Research Society (EMRS 2008): Symposium H: Materials and emerging technologies for non-volatile-memory devices, Strasbourg, France, June 26-30 2008.
Year:
2008
Laboratories:




 Record created 2009-03-03, last modified 2018-09-13

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