Comparison of ELNES and NEXAFS of Vanadium oxide V2O5 with different spectral resolutions
2002
Details
Title
Comparison of ELNES and NEXAFS of Vanadium oxide V2O5 with different spectral resolutions
Author(s)
Su, D. S. ; Hävecker, M. ; Knopp-Gericke, A. ; Mayer, R. ; Hébert, C. ; Schlögl, R.
Published in
Microscopy and Microanalysis
Volume
8
Issue
2
Pages
602-603
Conference
Microscopy and Microanalysis 2002, Quebec City, Canada, August 4–8, 2002
Date
2002
Publisher
Cambridge University Press
Laboratories
LSME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LSME - Electron Spectrometry and Microscopy Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2009-02-18