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research article
Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides
Electron energy-loss near-edge structure data for the N K and the Cr L 2,3 edges of CrN and Cr2N have been acquired in order to distinguish between these chromium nitride modifications. The N K edge spectra of these compounds have been modelled using both band structure and multiple scattering methods. We compare the results of these calculations with the experimental edges which have been recorded using a conventional transmission electron microscope (TEM) as well as a monochromated TEM (Wien filter).
Type
research article
Authors
Publication date
2004
Published in
Volume
130
Issue
3-4
Start page
209
End page
213
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 17, 2009
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