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research article

Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Mitterbauer, C.
•
Hébert, C.  
•
Kothleitner, G.
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2004
Solid State Communications

Electron energy-loss near-edge structure data for the N K and the Cr L 2,3 edges of CrN and Cr2N have been acquired in order to distinguish between these chromium nitride modifications. The N K edge spectra of these compounds have been modelled using both band structure and multiple scattering methods. We compare the results of these calculations with the experimental edges which have been recorded using a conventional transmission electron microscope (TEM) as well as a monochromated TEM (Wien filter).

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Type
research article
DOI
10.1016/j.ssc.2004.01.045
Author(s)
Mitterbauer, C.
Hébert, C.  
Kothleitner, G.
Hofer, F.
Schattschneider, P.
Zandbergen, H. W.
Date Issued

2004

Published in
Solid State Communications
Volume

130

Issue

3-4

Start page

209

End page

213

Subjects

A. Chromium nitride

•

C. Scanning and transmission electron microscopy

•

E. Electron energy loss spectroscopy

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSME  
Available on Infoscience
February 17, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/35368
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