Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Mitterbauer, C.; Hébert, C.; Kothleitner, G.; Hofer, F.; Schattschneider, P.; Zandbergen, H. W.

doi:10.1016/j.ssc.2004.01.045

Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Mitterbauer, C. ; Hébert, C. ; Kothleitner, G. ; Hofer, F.[...]

Electron energy-loss near-edge structure data for the N K and the Cr L 2,3 edges of CrN and Cr2N have been acquired in order to distinguish between these chromium nitride modifications. The N K edge spectra of these compounds have been modelled using both band structure and multiple scattering methods. We compare the results of these calculations with the experimental edges which have been recorded using a conventional transmission electron microscope (TEM) as well as a monochromated TEM (Wien filter).

Published in:

Solid State Communications, 130, 3-4, 209-213

Year:

2004

ISSN:

00381098

Keywords:

A. Chromium nitride ; C. Scanning and transmission electron microscopy ; E. Electron energy loss spectroscopy

DOI:

10.1016/j.ssc.2004.01.045

Laboratories:

LSME