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  4. High resolution EELS using monochromator and high performance spectrometer: Comparison of V2O5 ELNES with NEXAFS and band structure calculations
 
research article

High resolution EELS using monochromator and high performance spectrometer: Comparison of V2O5 ELNES with NEXAFS and band structure calculations

Su, D. S.
•
Zandbergen, H. W.
•
Tiemeijer, P. C.
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2003
Micron

Using single crystal V2O5 as a sample, we tested the performance of the new aberration corrected GATAN spectrometer on a monochromatised 200 kV FEG FEI (S)TEM. The obtained V L and O K ELNES were compared with that obtained in a common GATAN GIF and that in the new spectrometer, without monochromatised beam. The performance of the new instrumentation is impressive: recorded with an energy-resolution of 0.22 eV, the V L3 edge reveals all the features due to the bulk electronic structure, that are also revealed in near-edge X-ray absorption fine structure (NEXAFS) with a much higher energy-resolution (0.08 eV). All features of the ELNES and NEXAFS are in line with a theoretical spectrum derived from band-structure calculations.

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Type
research article
DOI
10.1016/S0968-4328(03)00033-7
Author(s)
Su, D. S.
Zandbergen, H. W.
Tiemeijer, P. C.
Kothleitner, G.
Hävecker, M.
Hébert, C.  
Knop-Gericke, A.
Freitag, B. H.
Hoferd, F.
Schlögl, R.
Date Issued

2003

Published in
Micron
Volume

34

Issue

3-5

Start page

235

End page

238

Subjects

Divanadium pentoxide

•

DOS

•

ELNES

•

Energy-resolution

•

Monochromator

•

Near-edge X-ray absorption fine structure

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSME  
Available on Infoscience
February 17, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/35364
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