High resolution EELS using monochromator and high performance spectrometer: Comparison of V2O5 ELNES with NEXAFS and band structure calculations

• Published in: Micron (ISSN: 09684328 (ISSN)), vol. 34, num. 3-5, p. 235-238
• Publication date: 2003

Using single crystal V2O5 as a sample, we tested the performance of the new aberration corrected GATAN spectrometer on a monochromatised 200 kV FEG FEI (S)TEM. The obtained V L and O K ELNES were compared with that obtained in a common GATAN GIF and that in the new spectrometer, without monochromatised beam. The performance of the new instrumentation is impressive: recorded with an energy-resolution of 0.22 eV, the V L3 edge reveals all the features due to the bulk electronic structure, that are also revealed in near-edge X-ray absorption fine structure (NEXAFS) with a much higher energy-resolution (0.08 eV). All features of the ELNES and NEXAFS are in line with a theoretical spectrum derived from band-structure calculations.

Keywords: Divanadium pentoxide ; DOS ; ELNES ; Energy-resolution ; Monochromator ; Near-edge X-ray absorption fine structure

Reference

• LSME-ARTICLE-2003-005
• doi:10.1016/S0968-4328(03)00033-7

Record created on 2009-02-17, modified on 2017-05-12