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research article
Free Electrons and Defects in Microcrystalline Silicon studied by Electron Spin Resonance
1994
Type
research article
Authors
Finger, F.
•
Malten, C.
•
Hapke, P.
•
Carius, R.
•
Flückiger, R.
•
Wagner, H.
Publication date
1994
Published in
Volume
70
Start page
247
End page
254
Note
IMT-NE Number: 186
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 10, 2009
Use this identifier to reference this record