System-Level Design for Nano-Electronics

Latest fabrication technologies of self-assembly nano-circuits (carbon nanotubes, silicon nanowires, etc.) have deployed bottom-up techniques that reach feature sizes well below 65nm, holding great promise for future large silicon-based integrated circuits. However, new nano-devices intrinsically have much higher failure rates than CMOS-based ones. Thus, new design methodologies must address the combination of devicelevel error-prone technologies with system integration constraints (low power, performance) to deliver competitive devices at the nanometer scale. In this paper we show that a very promising way to achieve nano-scale devices is combining imperfection-aware design techniques during fabrication with gate defect modeling at circuit level. Our results using this approach to define a Carbon Nanotube Field-Effect Transistor (CNFET)-based design flow for nanoscale logic circuits attain more than 3x energy-delay-product advantage compared to 65nm CMOS-based ones.


Published in:
Proceedings of the 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 1, 1, 747-751
Presented at:
14th IEEE International Conference on Electronics, Circuits and Systems (ICECS), Marrakech, Morocco, December 9-12, 2007
Year:
2007
Publisher:
New York, IEEE Circuits and Systems Society
Keywords:
Laboratories:




 Record created 2009-01-28, last modified 2018-12-03

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