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research article
Preparation and structural characterization of thin-film CdTe/CdS heterojunctions
The structural characteristics of CdTe/CdS thin-film heterojunctions are investigated. The studied heterojunctions were obtained by successive thermal evaporation under vacuum onto unheated SnO2 coated glass substrates of CdS and CdTe films, respectively. The morphological and structural studies of the above mentioned heterojunction component films, in comparison with those of CdS and CdTe films, deposited separately, onto glass substrates, were carried out using transmission electron microscopy, X-ray diffraction and atomic force microscopy techniques.
Type
research article
Web of Science ID
WOS:000238506500008
Authors
Publication date
2006
Volume
8
Issue
3
Start page
936
End page
940
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
October 12, 2008
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