Home > CTEM quantification of stacking fault tetrahedra in irradiated Cu
 

CTEM quantification of stacking fault tetrahedra in irradiated Cu

Schaeublin, R. ; Dai, Y. ; Victoria, M.

Year:
1998
Note:
Electron Microscopy 1998
Laboratories:
SPC
CRPP

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > SPC - Swiss Plasma Center > SPC - Swiss Plasma Center
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published



 Record created 2008-05-13, last modified 2018-09-13


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