research article
Quantitative Imaging of InGaAs/GaAs Layers Using Transmission Electron Microscopy Methods: Characterization of Stresses and Chemical Composition
Type
research article
Web of Science ID
WOS:000176512900111
Date Issued
2002
Published in
Volume
237-239
Start page
1471
End page
1475
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
Available on Infoscience
February 29, 2008
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