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Quantitative Imaging of InGaAs/GaAs Layers Using Transmission Electron Microscopy Methods: Characterization of Stresses and Chemical Composition

Leifer, K. ; Buffat, P.A. ; Cagnon, J. ; Kapon, E. ; Rudra, A. ; Stadelmann, P.A.

Published in:
J. Crystal Growth, 237-239, 1471-1475
Year:
2002
DOI:
10.1016/S0022-0248(01)02297-7
Other identifiers:
View record in Web of Science
Laboratories:
CIME
LPN

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LPN - Laboratory of the Physics of Nanostructures
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2008-02-29, last modified 2018-12-03


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