Quantitative Imaging of InGaAs/GaAs Layers Using Transmission Electron Microscopy Methods: Characterization of Stresses and Chemical Composition
2002
Details
Title
Quantitative Imaging of InGaAs/GaAs Layers Using Transmission Electron Microscopy Methods: Characterization of Stresses and Chemical Composition
Author(s)
Leifer, K. ; Buffat, P.A. ; Cagnon, J. ; Kapon, E. ; Rudra, A. ; Stadelmann, P.A.
Published in
Journal of Crystal Growth
Volume
237-239
Pages
1471-1475
Date
2002
Other identifier(s)
View record in Web of Science
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPN - Laboratory of the Physics of Nanostructures
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2008-02-29