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research article

Theoretical and Experimental Limits of the Analysis of III/V Semiconductors using EELS

Leifer, K.  
•
Buffat, P.A.  
•
Stadelmann, P.A.  
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2000
Micron
  • Details
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Type
research article
DOI
10.1016/S0968-4328(99)00119-5
Web of Science ID

WOS:000085976800010

Author(s)
Leifer, K.  
Buffat, P.A.  
Stadelmann, P.A.  
Kapon, E.  
Date Issued

2000

Published in
Micron
Volume

31

Start page

411

End page

427

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPN  
CIME  
Available on Infoscience
February 29, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/19658
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