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Theoretical and Experimental Limits of the Analysis of III/V Semiconductors using EELS

Leifer, K. ; Buffat, P.A. ; Stadelmann, P.A. ; Kapon, E.

Published in:
Micron, 31, 411-427
Year:
2000
DOI:
10.1016/S0968-4328(99)00119-5
Other identifiers:
View record in Web of Science
Laboratories:
CIME
LPN

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LPN - Laboratory of the Physics of Nanostructures
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2008-02-29, last modified 2018-12-03


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