Theoretical and Experimental Limits of the Analysis of III/V Semiconductors using EELS
2000
Details
Title
Theoretical and Experimental Limits of the Analysis of III/V Semiconductors using EELS
Author(s)
Leifer, K. ; Buffat, P.A. ; Stadelmann, P.A. ; Kapon, E.
Published in
Micron
Volume
31
Pages
411-427
Date
2000
Other identifier(s)
View record in Web of Science
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPN - Laboratory of the Physics of Nanostructures
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2008-02-29