A 90nm CMOS Cryptographic Core with Improved Fault- Tolerance in Presence of Massive Defect Density


Published in:
Proceedings of the International Conference on Nano-Networks, Nano-Net
Presented at:
International Conference on Nano-Networks, Nano-Net, Catania, Italy, September 24-26
Year:
2007
Laboratories:




 Record created 2008-01-08, last modified 2018-03-17


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