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conference paper
A 90nm CMOS Cryptographic Core with Improved Fault- Tolerance in Presence of Massive Defect Density
2007
Proceedings of the International Conference on Nano-Networks, Nano-Net
Type
conference paper
Authors
Publication date
2007
Published in
Proceedings of the International Conference on Nano-Networks, Nano-Net
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Catania, Italy | September 24-26 | |
Available on Infoscience
January 8, 2008
Use this identifier to reference this record